No deliveries for this seminar are currently scheduled.

You may be interested in the following archives of this seminar:

• X-ray Fluorescence (XRF) Session 1: Introduction and Basic XRF Concepts (August 4, 2008)
• X-ray Fluorescence (XRF) Session 2: Representativeness Part 1 (August 7, 2008)
• X-ray Fluorescence (XRF) Session 3: Representativeness Part 2 (August 11, 2008)
• X-ray Fluorescence (XRF) Session 4: Demonstration of Method Applicability (DMA) (August 14, 2008)
• X-ray Fluorescence (XRF) Session 5: Quality Control (August 18, 2008)
• X-ray Fluorescence (XRF) Session 6: Dynamic Work Strategies Part 1 (August 21, 2008)
• X-ray Fluorescence (XRF) Session 7: Dynamic Work Strategies Part 2 (August 25, 2008)
• X-ray Fluorescence (XRF) Session 8: Q&A and Resources Review (August 28, 2008)

This 8-part internet seminar series covers material that generally is not presented in XRF presentations or training courses. This is an applications course: how can a FP-XRF be used so that its data are highly dependable and defensible. Sampling design and sample handling options for FP-XRF will be covered, along with the benefits and limitations of each. Analytical and QC concerns common to using XRF are also discussed. This course will be of interest to staff developing XRF sampling and analysis plans, reviewing the plans for quality assurance, field operators, and users of XRF data for making project decisions. Concepts and practice will be illustrated using experiences from actual field projects. The capabilities of newer FP-XRF instruments will be described. Participants may register for any session of interest, but are highly encouraged to attend all 8 sessions for the full benefit of the course.

• Deana Crumbling, U.S. EPA, Technology Innovation Program (crumbling.deana@epa.gov)
• Stephen Dyment, U.S. EPA, Technology Innovation Program (dyment.stephen@epa.gov)
• Bob Johnson, Argonne National Laboratory (rlj@anl.gov)

• Jean Balent, U.S. EPA, Technology Innovation Program (balent.jean@epa.gov)

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