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DETERMINATION OF NANOMECHANICAL PROPERTIES BY ATOMIC FORCE MICROSCOPY: SCIENTIFIC OPERATING PROCEDURE SOP-C-#
Cuddy, M.F., A.R. Poda, and M.S. Hull. ERDC/EL SR-15-1, 26 pp, 2015

This operating procedure describes how to determine the nanomechanical properties, hardness, and Young's modulus at solid surfaces using atomic force microscopy (AFM). Briefly, an appropriate AFM cantilever is calibrated to determine its deflection sensitivity and spring constant; it then is used as both an imager and indenter at the surface of material of interest. The load applied by the cantilever is accurately controlled by knowledge of the deflection sensitivity. The maximum applied load is mediated by the cantilever spring constant. Following data collection, image and force curve analyses are completed to determine projected indent areas and to load/unload profiles, thus yielding materials properties that include the material hardness and the Young's modulus along with corresponding surface topography. http://www.dtic.mil/cgi-bin/GetTRDoc?AD=ADA616441
This procedure is further discussed in a 12-minute video at https://www.youtube.com/watch?v=iSvh-Qs_2BA.



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